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Scanning Electron Microscopy and X-Ray Microanalysis - 9781461349693
Scanning Electron Microscopy and X-Ray Microanalysis - 9781461349693
Scanning Electron Microscopy and X-Ray Microanalysis - 9781461349693
Scanning Electron Microscopy and X-Ray Microanalysis - 9781461349693
Scanning Electron Microscopy and X-Ray Microanalysis - 9781461349693
Scanning Electron Microscopy and X-Ray Microanalysis - 9781461349693
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Scanning Electron Microscopy and X-Ray Microanalysis - 9781461349693

Scanning Electron Microscopy and X-Ray MicroanalysisThird Edition

Author(s): Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael

Format: Paperback

Publisher: Springer-Verlag New York Inc., United States

Imprint: Springer-Verlag New York Inc.

ISBN-13: 9781461349693, 978-1461349693

Synopsis

In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) a.

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Scanning Electron Microscopy and X-Ray Microanalysis - 9781461349693

Scanning Electron Microscopy and X-Ray MicroanalysisThird Edition

Author(s): Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael

Format: Paperback

Publisher: Springer-Verlag New York Inc., United States

Imprint: Springer-Verlag New York Inc.

ISBN-13: 9781461349693, 978-1461349693

Synopsis

In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) a.

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Product Description

Scanning Electron Microscopy and X-Ray MicroanalysisThird Edition

Author(s): Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael

Format: Paperback

Publisher: Springer-Verlag New York Inc., United States

Imprint: Springer-Verlag New York Inc.

ISBN-13: 9781461349693, 978-1461349693

Synopsis

In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) a.

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format

trade paperback

Language

english

type

textbook

Color

multicolor

Gender

unisex

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Joseph Goldstein

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