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Nanoscience and Technology Ser.: Atomic Force Microscopy, Scanning Nearfield ...
Nanoscience and Technology Ser.: Atomic Force Microscopy, Scanning Nearfield ...
Nanoscience and Technology Ser.: Atomic Force Microscopy, Scanning Nearfield ...
Nanoscience and Technology Ser.: Atomic Force Microscopy, Scanning Nearfield ...
Nanoscience and Technology Ser.: Atomic Force Microscopy, Scanning Nearfield ...
Nanoscience and Technology Ser.: Atomic Force Microscopy, Scanning Nearfield ...
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Nanoscience and Technology Ser.: Atomic Force Microscopy, Scanning Nearfield ...

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and NanoscratchingApplication to Rough and Natural Surfaces

Author(s): Gerd Kaupp

Format: Paperback

Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Germany

Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K

ISBN-13: 9783642066634, 978-3642066634

Synopsis

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of na.

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Nanoscience and Technology Ser.: Atomic Force Microscopy, Scanning Nearfield ...

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and NanoscratchingApplication to Rough and Natural Surfaces

Author(s): Gerd Kaupp

Format: Paperback

Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Germany

Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K

ISBN-13: 9783642066634, 978-3642066634

Synopsis

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of na.

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Product Description

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and NanoscratchingApplication to Rough and Natural Surfaces

Author(s): Gerd Kaupp

Format: Paperback

Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Germany

Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K

ISBN-13: 9783642066634, 978-3642066634

Synopsis

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of na.

Product Specifications

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format

trade paperback

Language

english

series

nanoscience and technology ser.

type

textbook

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Springer-Verlag Berlin and Heidelberg GmbH & Co. K

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